page 1 of 5 atmel corporation tel :(408)441-0311 fax :(408)436-4200 AT-89S8252 flash reliability data - 125c dynamic lifetest (plastic) - 150c retention bake (plastic) - 121c/15psg presssure pot test - extended temperature cycle july 2003 2325 orchard parkway san jose ca. 95131
page 2 of 5 AT-89S8252 plastic package 125c dynamic lifetest lot date sample total number number of number code size hours (k) failures 8a1867-1 8a9841 100 100.0 0 9b0070 9b992 5 100 100.0 0 failure rate total device hours 200,000 device hours best estimate l = 0.4% per 1,000 hours 50 c ambient extrapolation to 50 c via arrhennius equation and activation energy of 0.5ev l = 0.01% per 1,000 hours (111 fits) confidence estimate l 60 = 0.01% per 1,000 hours 60% confidence (154 fits) l 90 = 0.04% per 1,000 hours 90 % confidence (390 fits)
page 3 of 5 AT-89S8252 plastic package 150c retention bake lot date sample total number number of number code size hours (k) failures 8a1867-1 8a9841 100 100.0 0 9b0070 9b9925 50 50.0 0 failure rate total device hours 150,000 device hours best estimate l = 0.7% per 1,000 hours 50 c ambient extrapolation to 50 c via arrhennius equation and activation energy of 0.5ev l = 0.01% per 1,000 hours (98 fits) confidence estimate l 60 = 0.01% per 1,000 hours 60% confidence (131 fits) l 90 = 0.03% per 1,000 hours 90% confidence (326 fits)
page 4 of 5 AT-89S8252 plastic package 121c/15psg pressure pot test date package sample number of failures code type size at indicated hours (24) (48) (72) (96) 9b9925 44 plcc 50 0 0 0 0
page 5 of 5 AT-89S8252 plastic package extended temperature cycle -65c to +150c plcc/tsop/soic/pdip -55c to +125c cbga date package sample number of number of code type size cycles failures 8a9841 44 plcc 50 1000 0 9a9925 44 plcc 50 1000 0
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